Media Summary: Bill Keller, Product Engineer at Siemens EDA, introduces ATPG Boost, a set of new capabilities in Inefficient conventional fault model need to be replaced for the current technology nodes to be cost effective. A new fault model ... This video describes the steps required to generate scan patterns for a hierarchical, wrapped core and retarget those patterns to ...
Tessent Testkompress High Quality Test - Detailed Analysis & Overview
Bill Keller, Product Engineer at Siemens EDA, introduces ATPG Boost, a set of new capabilities in Inefficient conventional fault model need to be replaced for the current technology nodes to be cost effective. A new fault model ... This video describes the steps required to generate scan patterns for a hierarchical, wrapped core and retarget those patterns to ... As design pushes deeper into data-driven architectures, so does
